"Show yourself in all respects to be a model of good works, and in your teaching show integrity, dignity, and sound speech that can not be condemned." (Titus 2:7)

 

 

 

Dr. Myong K. Jeong

 

 

 

 

 

 

 

 

 

 

 

 

Assistant Professor

Ph.D., Georgia Tech.

311 East Stadium Hall
Knoxville, TN 37996-0700
Phone: (865) 974-0234
Fax: (865) 974-0588
E-mail: mjeong at utk dot edu

 

 

 

 

 

Click here to view my e-Album

 

 

 

 

 

 

 

 

 

 

Honors and Awards:

 

  • National Science Foundation (NSF) CAREER Award (2007 - 2012)
  • Chancellor’s Award for Professional Promise in Research and Creative Achievement, 2008, Nominee (Under Review)
  • Freund International scholarship (2002 - 2004): a national competition award.
  • INFORMS 2003 QSR Best Student Paper Competition Finalist.
  • Face of Quality Progress (December 2002).
  • NAFSA Awards for Excellent International Students (by Association of International Educators): 2001-2002

 

Education:

 

·         Ph.D. in Industrial and Systems Engineering, May 2004
Georgia Institute of Technology, Atlanta, Georgia.
Minor: Signal Processing Techniques for Data Mining.
Thesis: Wavelet Based Methodology in Data Mining for High-Dimensional and Complicated Function Data.

·         M.S. in Statistics, December 2002
Georgia Institute of Technology, Atlanta, Georgia.

·         M.S. in Industrial Engineering, February 1993.
Korea Advanced Institute of Science and Technology (KAIST), Taejon, Korea.
Thesis: A Study on the Estimation of Signal-to-Noise Ratios of Robust Design.

·         B.S. in Industrial Engineering, February 1991.
HanYang University, Seoul, Korea.

 

Research Areas:

 

·         Data Mining and Knowledge Discovery
Support vector machines, kernel-based methods, on-line learning, machine learning, feature selection and extraction, pattern recognition, clustering, hidden Markov model, neural networks

  • Manufacturing
    Residual stress analysis of a wafer, nano-scale contamination monitoring on the surface of a wafer, automatic control of multi-stage process, monitoring of deposition process, spatial modeling of wafermap data
  • Security and Intrusion Detection
    Data mining methods for host/network intrusion detection, intrusion detection for wireless networks, fraud detection, profile analysis
  • Hyperspectral Image Analysis
    Spectral band selection, automatic detection of poultry skip tumor, data reduction, image denoising

·         Wavelets
Data reduction, de-noising, wavelet application for diagnosis, multi-scale analysis, functional data analysis

  • Quality & Reliability Engineering
    Machine health monitoring, quality and process improvement, control charts, simulation, reliability analysis of complex systems

·         Statistical Modeling for Medical Applications (Microarray, Metabolomics)
Classification, clustering, regression, chemometrics

 

Professional Experience:

 

·         Assistant Professor, Department of Industrial and Information Engineering, University of Tennessee, Knoxville, June 2004 - present

·         Graduate Research Assistant/Instructor, School of Industrial and Systems Engineering, Georgia Institute of Technology, Atlanta, August 1999 - May 2004

·         Senior Research Member, Internet Technology Laboratory, Electronics and Telecommunications Research Institute, Taejon, Korea, March 1998- July 1999

·         Research Member, Quality and Reliability Engineering Laboratory, Electronics and Telecommunications Research Institute, Taejon, Korea, March 1993- February 1998

·         Graduate Research Assistant, Department of Industrial Engineering, KAIST, Taejon, Korea, March 1991- February 1993

 

Patents:

 

·         Myong K. Jeong, The Method of Estimating the Cutoff Connection Rate in the ATM Switching System Using Simulation, Patent Registration No. 1002373970000 (Korea), January 15, 2000

 

Book Chapters:

 

  1. Myong K. Jeong, S. Kong, O. A. Omitaomu, and A. Badiru, Data Mining in Multi-dimensional Functional Data for Manufacturing Fault Diagnosis, 2005 (to appear in Mining Enterprise Data; Editor T. Warren Liao and Evangelos Triantaphyllou)

 

Journal Publications:

(Underline indicates current/former students, visiting scholars; * indicates the corresponding author)

 

1.      F. Yi and M. K. Jeong (in press), Robust Probabilistic Multivariate Calibration Models, Technometrics

2.       Y. Jeong, S. J. Kim, and M. K. Jeong (in press), “Automatic Identification of Defect Patterns in Semiconductor Wafer Maps Using Spatial Correlogram and Dynamic Time Warping,” IEEE Transaction on Semiconductor Manufacturing System

3.       N. Labbe, H. Cho, M. K. Jeong, and N. Andre (in press), “Enhanced Discrimination and Calibration of Biomass NIR Data Using Nonlinear Kernel Methods,” Bioresource Technology Journal.

4.       H. Cho, M. K. Jeong, and Y. Kwon (in press), “Support Vector Data Description for Calibration Monitoring of Remotely Located Micro Robot System,” Journal of Manufacturing Systems.

5.      H. Cho, S. B. Kim, M. K. Jeong, Y. Park, T. R. Ziegler, and D. P. Jones (in press), “Discovery of Metabolite Features for the Modeling and Analysis of High-Resolution NMR Spectra” International Journal of Data Mining and Bioinformatics

6.       J. I. Park, S. J. Kim, and M. K. Jeong (in press), “A New Tolerance Design Method for a Secondary Battery Using Design of Experiments with Mixture,” Quality and Reliability Engineering International

7.      A. Taylor, S. Baek. M. K. Jeong, and G. Nix (in press), “Wood Shrinkage Prediction Using NIR Spectroscopy,” Wood and Fiber Science.

8.      H. Cho, K. Kim, and M. K. Jeong (in press), “Determination of Influential Factors and Diagnostics Using Multivariate Statistical Relationships between Variables and Faults,” Expert Systems with Applications.

9.       H. Cho, S. B. Kim, M. K. Jeong, Y. Park, T. R. Ziegler, and D. P. Jones (in press), “Genetic Algorithm-Based Feature Selection in High-Resolution NMR Data,” Expert Systems with Applications.

10.  O. Omitaomu, M. K. Jeong*, A. Badiru, and J. W. Hines (2007), “On-Line Support Vector Regression Approach for the Monitoring of Motor Shaft Misalignment and Feedwater Flow Rate,” IEEE Transactions on Systems, Man, Cybernetics, Part C, 37(5), 962-970.

11.  H. Cho and M. K. Jeong (2008), “Enhanced Prediction of Misalignment Conditions from Spectral Data Using Feature Selection and Filtering,” Expert Systems with Applications, 37(1).

12.   M. K. Jeong*, J. C. Lu, W. Zhou, and S. K. Ghosh (2007), “Data Reduction Method for Spatial Data Using a Structured Wavelet Model,” International Journal of Production Research., 45(10), 2295-2311

13.   Z. Du, M. K. Jeong*, and S. Kong (2007), “Band Selection of Hyperspectral Images for Automatic, Poultry Tumor Detection,” IEEE Transactions on Automation Science and Engineering, 4(3), 332-339.

14.   O. Omitaomu, M. K. Jeong*, A. Badiru, and J. W. Hines (2006), “On-line Prediction of Motor Shaft Misalignment Using Fast Fourier Transform Generated Spectra Data and Support Vector Regression,” ASME Transactions, Journal of Manufacturing Science and Engineering, 128 (4), 1019-1024.

15.  U. Jung, M. K. Jeong*, and J. C. Lu (2006), “A Vertical-Energy-Thresholding Procedure for Data Reduction with Multiple Complex Curves,” IEEE Transactions on Systems, Man, Cybernetics, Part B, 36(5), 1128-1138.

16.  M. K. Jeong, J. C. Lu, X. Huo, B. Vidakovic, and D. Chen (2006), "Wavelet-based Data Reduction Techniques for Process Fault Detection," Technometrics, 48(1), 26-40.

17.   M. K. Jeong, J. C. Lu, and N. Wang (2006), "Wavelet-Based SPC Procedure for Complicated Functional Data," International Journal of Production Research, 44(4), 729- 744.

18.   U. Jung, M. K. Jeong*, and J. C. Lu (2006), “Data Reduction for Multiple Functional Data with Class Information,” International Journal of Production Research (leading article of the special issue of Data Mining in Engineering Design, Manufacturing and Logistics), 44, 2695-2710.

19.   H. Cho, K. Kim, and M. K. Jeong (2006), “On-line Monitoring and Diagnosis of Batch Processes: Empirical Model-based Framework and A Case Study,” International Journal of Production Research, 44 (12), 2361-2378.

20.   H. Cho, K. Kim, and M. K. Jeong (2005), “Multivariate Statistical Diagnosis Using Triangular Representation of Fault Patterns in Principal Component Space,” International Journal of Production Research, 43(24), 5181-5198.

21.   Y. Kwon, M. K. Jeong, and O. Omitaomu (2005) “Characterization of Closed-Loop Inspection Accuracy Based on the Spindle Probe and CMM,” International Journal of Machine Tools and Manufacture, 45(12), 1-8.

22.   M. K. Jeong, M. Perry, and C. Zhou (2005), "Throughput Gain with Parallel Flow in Automated Flow Lines," IEEE Transactions on Automation Science and Engineering, 2(1), 84-86.

23.   J. S. Fenner, M. K. Jeong , and J. C. Lu (2005), "Optimal Automatic Control of Multistage Production Processes," IEEE Transaction on Semiconductor Manufacturing System, 18(1), 94-103.

24.   M. K. Jeong, D. Chen, and J. C. Lu (2003), "Thresholded Scalogram and Its Application in Process Fault Detection," Applied Stochastic Models in Business and Industry, 19(3), 231-244.

25.   M. K. Jeong*, S.Y. Lee, C.O. Jeong, and J.S. Koh (1996), "ERIS (ETRI Reliability Information System): A Reliability Design Tool for Telecommunication Systems," Computers and Industrial Engineering, 30(3), 523-530

 

Journal Papers in Revision:

 

1.    M. K. Jeong, J. C. Lu, and M. Yuan (2005), "A Wavelet-based Mean and Variance Thresholding Model for Multiple Sets of Functional Data," in revision, Technometrics.

2.    O. A. Omitaomu, M. K. Jeong, A. Badiru, and J. Ma, "On-line Support Vector Regression with Adaptive Parameters," submitted to IEEE Transactions on Knowledge and Data Engineering

3.    O. A. Omitaomu, M. K. Jeong, S. Bae, and A. Badiru, "Wavelet Thresholding via Step-Down Tests," submitted to Computational Statistics and Data Analysis.

4.     S. Lee, H. Cho, N. Labbe, M. K. Jeong, T. G. Rials,  “Quick Assessment of Thermal Decomposition Behavior of Lignocellulosic Biomass by Near Infrared Spectroscopy and Statistical Analysis,” submitted to Biomass and Bioenergy.

5.     J. S. Fenner, M. K. Jeong, and J. C. Lu (2006), "Bayesian Parallel Multi-Stage Model for Uniformity Modeling," IIE Transaction on Quality and Reliability (invited for revision).

 

Conference/Symposium Presentations:

 

1.     A. M. Taylor, T. Young, C. Steiner,M. K Jeong, “Hardwood Lumber Manufacturing Optimization Using NIR Spectroscopy,” International Scientific Conference on Hardwood Processing, September 24-26, Quebec City, Canada.

2.     S. Kim and M. K. Jeong (2007),”Statistical Monitoring Yield and Spatial Dependence in the Silicon Wafer Manufacturing,” 2007 INFORMS International Conference, July 8-11, Puerto Rico.

3.     M. K. Jeong, S. Baek, H. Cho, and S. Kim (2007), “Kernel-based Monitoring Procedure for Forrest Products Manufacturing,” 2007 INFORMS International Conference, July 8-11, Puerto Rico.

4.    Seung H. Baek, Myong K. Jeong, Hyun-Woo Cho (2007), “On-line Prediction Methodology for Rapid Characterization of Chemical and Physical Properties of Bio-fuels,” 2007 IIE Annual Conference, May 20 - 24, Nashville, Tennessee.

5.    J. C. Lu, M. K. Jeong, and C. Shen (2006), “Bayesian Mean and Variance Wavelet Thresholding for Multiple Complicated Functional Data,” 2006 INFORMS Annual Conference, November 5-8, Pittsburgh, Pennsylvania.

6.     H. Cho and M. K. Jeong (2006), “Kernel-Based Biomass Monitoring Based on NIR Spectroscopy in Forest Products Manufacturing Industry,” 2006 INFORMS Annual Conference, November 5-8, Pittsburgh, Pennsylvania.

7.     S. Kim, Y. Jeong, and M. K. Jeong (2006), “A Spatial Autocorrelation Analysis in Semiconductor Wafer Maps,” 2006 INFORMS Annual Conference, November 5-8, Pittsburgh, Pennsylvania.

8.     Y. Jeong, M. K. Jeong, M. Leitnaker (2006), “EWMA and CUSUM Control Chart Using Wavelets for Complicated Functional Data,” 2006 INFORMS Annual Conference, November 5-8, Pittsburgh, Pennsylvania.

9.     J. Koh and M. K. Jeong (2006), “Heuristic Optimization for the Restoration Shceme of the ATM Network,” Asia-Pacific Conference on Communications, 351-354, August 31- September 1, Busan, Korea.

10. J. C. Lu, P. Kvam, and M. K. Jeong (2006), "A Wavelet-Based Variance Thresholding Model for Multiple Curves," 2006 NSF Design, Service, and Manufacture Research and Grantees Conference, July.24-27, Saint Louis, Missouri.

11. O. Omitaomu, M. K. Jeong, S. Bae, and A Badiru (2006), “Wavelet Step-Down Thresholding Procedure for Process Monitoring Using Very High Dimensional Data,” 6th Annual MOPTA Conference on Modeling and Optimization: Theory and Applications, July 24-27, Waterloo ON Canada

12. H. Cho, S. Kim, and M. K. Jeong (2006), “Multivariate Statistical Approach Applied to 1H NMR Based Metabolic Profiling,” 2006 Joint Research Conference on Statistics in Quality, Industry, and Technology, June 9-10, Knoxville, TN.

13.  J. Koh, M. K. Jeong, and Y. Kim (2006), “The Path Restoration Algorithm for the High-Speed Networks Using the Genetic Algorithm,” 2006 IIE Annual Conference, May 20 - 24, Orlando, Florida

14.  F. Yi, H. Cho, and M. K. Jeong (2006), “Health Monitoring of a Shaft Transmission System via Hybrid Models of PCR and PLS,” SIAM 2006 Conference on Data Mining, 554-558, April 20 - 22, Bethesda, Maryland (Of the 244 submissions, only 75 papers were accepted).

15.  H. Cho and M. K. Jeong (2006), “Identification of Contributing Variables for Multivariate Statistical Process Monitoring,” 2006 IIE Annual Conference, May 20 - 24, Orlando, Florida

16.  M. K. Jeong, J. C. Lu, X. Huo, B. Vidakovic, and D. Chen (2005), "Wavelet-Based Data Reduction Techniques for Process Fault Detection," 2005 INFORMS Annual Conference (Technometrics-invited paper), November 13-16, San Francisco, CA.

17. M. K. Jeong, J. C. Lu, and M. Yuan (2005), "A Wavelet-Based Variance Thresholding Procedure for Multiple Curves," 2005 INFORMS Annual Conference, November 13-16, San Francisco, CA.

18. O. A. Omitaomu, M. K. Jeong, A. Badiru (2005), “Support Vector Regression Approach to Machinery Misalignment Prediction Using Online Support Vector Machine,” 2005 INFORMS Annual Conference, November 13-16, San Francisco, CA.

19. H. Cho and M. K. Jeong (2005), "Use of a Kernel Based Nonlinear Discriminant Analysis for Classifying Fault Data," 2005 INFORMS Annual Conference, November 13-16, San Francisco, CA.

20. O. A. Omitaomu, M. K. Jeong, A. Badiru (2005), “Motor Shaft Misalignment Prediction Using High-dimensional Power Spectrum Data,” 9th annual Maintenance and Reliability Conference, May 1-4, Knoxville, TN

21.  U. Jung, M. K. Jeong, and Jye-Chyi Lu (2005), “Optimal Vertical Group-Wise Threshold for Multiple Curves Considering Between-Class Separability,” 2005 IIE Annual Conference, May 14 - 18, Atlanta, Georgia

22. M. K. Jeong (2005), “Data Mining for High-Dimensional Functional Data and Engineering Applications,” ORAU/ORNL 2005 Partners in Technology Forum, April 21 - 22, Oak Ridge National Laboratory, Knoxville, Tennessee.

23.  U. Jung, J. C. Lu, and M. K. Jeong (2005), "A Local Random Effect Model for Multiple Curves," 2005 NSF Design, Service, and Manufacture Research and Grantees Conference, Jan. 3-6, Tampe, AZ.

24. M. K. Jeong and J. C. Lu (2004), "Optimal Automatic Control Incorporating Sensor Data of Multi-Stage Manufacturing Processes," 2004 INFORMS Annual Conference, October 24-27, Denver, Colorado.

25. J. C. Lu and M. K. Jeong (2004), "Analysis of Complex Two-dimensional Data for the In-Process Monitoring and Control," 2004 INFORMS Annual Conference, October 24-27, Denver, Colorado.

26. A. Na, M. K. Jeong, J. C. Lu, and N. Wang (2004), "Supply-Chain Oriented Robust Product/Process Design," 2004 INFORMS Annual Conference, October 23-27, Denver, Colorado.

27. J. C. Lu and M. K. Jeong (2004), “SPC Procedures for Complicated Functional Data,” Fifth Biennial International Conference on Statistics, Probability and Related Areas, May 14-16, 2004, the University of Georgia, Athens, GA.

28. U. K. Jung, J. C. Lu, and M. K. Jeong (2003), "Wavelet-Based Data Reduction Procedures for Multiple Functional Data Curves," 2003 Joint Statistical Meeting, August 3-7, San Francisco, CA.

29. J. C. Lu and M. K. Jeong (2003), "Wavelet-based SPC Procedures for Complicated Functional Data," 2003 INFORMS Annual Conference, October 19-22, Atlanta, GA.

30. J. C. Lu and M. K. Jeong (2003), "Multi-scale Control Charts for High-Dimensional Functional Data: The Step-Down Approach," 2003 INFORMS Annual Conference, October 19-22, Atlanta, GA.

31. M. K. Jeong and J. C. Lu (2002), "Wavelet-Based Methods for Mining Large Nonstationary Data," 2002 INFORMS Annual Conference, November 17-20, San Jose, CA.

32. M. K. Jeong and J. C. Lu (2002), "Data Mining with Wavelet-based Reduce-size Data," C. Warren Neel Conference on Statistical Data Mining and Knowledge Discovery, June 22-25, Knoxville, Tennessee.

33. J. C. Lu, U. K. Jung, and M. K. Jeong (2002), "Wavelet-Based Data Reduction for Detecting and Classifying Process Faults," 2002 INFORMS Annual Conference, November 17-20, San Jose, CA.

34. M. K. Jeong, K. R. Kang, J. H., Choi, and Y. H., Jeong (1999), "Design of Traffic Control Module in Inter-Working Gateway for Real-time Internet Services," 3rd Conference on Next Computing System, Taejon, Korea, 351-355.

35. M. K. Jeong and J. S. Koh (1998), "Reliability Analysis of a Fault-Tolerant System Considering Coverage Ratio Using the Petri-Net," CSNT '98, Taejon, Korea, 113-117.

36. M. K. Jeong and J. S. Koh (1997), "A Simulation Approach to the Estimation of Cutoff Connection Rate in the ATM Switching System," Proceedings of the ESREL '97 International Conference on Safety and Reliability, Lisbon, Portugal, 2233-2238.

37. M. K. Jeong and J. S. Koh (1995), "A New Reliability Allocation Model for the Hierarchical Switching System," International Conference on Quality and Reliability in Design, Orlando, 108-112.

 

Invited Tutorial:

 

  • Quality, Reliability, and Statistics in Nano-Technology, IFORS 2005 Triennical Conference (with J. C. Lu, S. L. Jeng, S. C. Lin, and N. Wang), July 11-15, Honolulu, Hawaii.

 

Software Products:

 

  • S. Lee, Myong K. Jeong, and J. Koh, ERIS: ETRI Reliability Information System for Quality and Reliability Design, 1997 (Commercial purpose)

 

Industrial Experience:

 

  • Senior Researcher, Internet Technology Laboratory, Electronics & Telecommunications Research Institute (ETRI), Taejon, Korea
    (March 1998 - July 1999)
    - Design of traffic control module in inter-working gateway for real-time internet Services
    - Performance evaluation of internet devices such as routers and B-ISDN terminals
  • Researcher, Quality & Reliability Engineering Laboratory, Electronics & Telecommunications Research Institute (ETRI), Taejon, Korea
    (March 1993 - February 1998)
    - Development of information system for quality and reliability design
    - Reliability and performance study of semiconductor devices and complex switching /transmission systems
    - Development of a simulator for the estimation of a cutoff connection rate in the switching system
    - Optimal experimental design of accelerated life tests for printed board assemblies (with KAIST)
  • Graduate Research Assistant, Manufacturing Research Center, Georigia Tech
    (August 2000- May 2004)
    - Development of data mining tools for process improvement in manufacturing and design with Intel (the process automation group)
    - Development of wavelet-based data reduction tools for decision-making with massive data with Nortel
    - Process design, modeling and optimization in electronics and manufacturing processes with JDS Uniphase
  • Graduate Research Assistant, Virtual Factory Laboratory, Georigia Tech
    (August 1999 - July 2000)
    - Implementation of 3-D simulation model for the Siemens SMT production line with Productivity Lift using a simulation tool (AutoMod) with Siemens
    - Theoretical comparisons of the throughputs for flow line and cluster line with bypass segment

 

Current Ph.D. Students:

 

·         Seung-Hyun Baek:  Working on “Multi-scale Kernel-Based Methods”(Transferred from Univ. of Arizona; expected to graduate Summer 2008)

·         Young-Seon Jeong: Working on “Process Monitoring with Nonlinear Profile Curves and Spatial Analysis of Semiconductor Wafer Map Data” (Started in Fall 2005)

  • Zheng Du (Electrical and Computer Engineering; advisor: Dr. Seong Kong): Band Selection of Hyperspectral Images Based on Advanced Data Mining Techniques
  • Ph.D. students in other departments who are working with me: Manoel Castro (Traffic Modeling Based on Advanced Data Mining, Advisor: Lee Han, Civil and Environmental Engineering)

 

Graduated Ph.D. Students:

 

·       Olufemi Abayomi Omitaomui (Oak Ridge National Laboratory)

Dissertation: On-line Learning and Wavelet-Based Feature Extraction Methodology for Process Monitoring Using High-Dimensional Functional Data” (co-advisor: Dr. Adedeji B. Badiru), Spring, 2006

·       Inho Kang (KIDA: Korea Institute for Defense Analysis)

Dissertation: Differentiated Intrusion Detection and Feature Selection in Anomaly Detection (co-advisor: Dr. Dong. Kong), Summer 2007

 

Graduated M.S. Students:

 

·       Fang Yi (Recipient of Hilton-Smith Graduate Fellowship)

Thesis: Latent Models with Application to Spectral Data Analysis (Fall 2006)

 

Mentor for Undergraduate Students:

 

·       A. Lherisson (Tennessee Technological University), Ronald McNair Summer Research Program, 2004. He won the best presentation award.

·       Keith Brooks

 

Current Visiting Scholars:

 

  • Jong-In Park (Senior Research Member at LG Electronics; Ph.D. in Industrial Engineering, KAIST): Reliability Modeling and Life Test Data Analysis of Secondary Battery, January 2007 – August 2009.
  • Sang-Hyun Choi (Associate Professor at Gyungsang National University; Ph.D. in Industrial Engineering, KAIST): Data Mining and Web Mining, February 2007 – January 2008.
  • Jong-hwan Kim (Professor at Daegu University; Ph.D. in Management Science, KAIST), January 2007 - January 2008.
  • Kyung-Eun Choi (Assistant Professor at Jeonju National University of Education; Ph.D. in Textile Engineering, Junbook National University), February 2007 - January 2008

 

Hosted Visiting Scholars:

 

  • Jaisang. Koh (Principal Research Staff at Electronics & Telecommunications Research Institute; Ph.D. in Industrial Engineering, Chonam National University): Quality of Service for High-Speed Networks, August 2005 – July 2006.
  • Seong-Jun Kim (Professor at Kangnung National University; Ph.D. in Industrial Engineering, KAIST): Spatial Data Mining, January 2006 – August 2007.
  • Hyun-Woo Cho (Research Engineer at Samsung Electronics, Ph.D. in Mechanical and Industrial Engineering, POSTECH)

 

Service to Professional Organizations:

 

·         Associate Editor, International Journal of Quality, Statistics and Reliability (2007 – current)

·         Council Member of INFORMS QSR (Quality, Statistics, and Reliability) Cluster (November 2007 – current)

·         Program Committee, the Fourth International Conference on Intelligent Computing (ICIC 2007), September 15–18, 2008, Shanghai, China

·         Program Committee, 2007 International Conference on Intelligent Computing (ICIC 2007), August 21–24, 2007, Qingdao Shandong Province, China

 

 

Professional Affiliations:

 

  • Institute of Industrial Engineers (IIE)
  • Institute for Operations Research & Management Sciences (INFORMS)
  • Institute of Electrical and Electronics Engineers (IEEE)
  • Society of Manufacturing Engineers (SME)

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

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