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  Methods

    Transmission Electron Microscopy

        Conventional Transmission Electron Microsocpy

      • Brightfield - Darkfield Imaging
      • Weak Beam Imaging
      • High Resolution (Phase Contrast) Imaging

        Electron Diffraction

      • Selected Area Diffraction
      • Convergent Beam Electron Diffraction

        Instruments

      • TEM Topcon O2B at NCSU
      • TEM/STEM JEOL 2010F at NCSU
      • dedicated STEM VG501 UX with Nion Aberration Corrector at ORNL
      • dedicated STEM VG603 U with Nion Aberration Corrector at ORNL

    Materials Simulations

    • Ab Initio Density Functional Theory
    • Finite Element Calculations

    Sample Preparation

      Cleaving Method
    • Conventional Method
    • Nanomaterials
    • Focused Ion Beam (FIB)